Nanospec 9300
发布时间:2015-03-27   浏览:3,032 views   调整大小: 16px  14px  12px



Advanced 300mm Metrology System


◆200 or 300mm wafer

◆Open cassette or 300mm Foup

◆DUV-Vsible Spectroscopic Reflectometry(SR) from 190 to 780 nm

◆T, n and k meaurementson single and multi-layer film stacks

◆Windows NT or XP operation system for real-time, multi-tasking operations

◆N2000 user interface compliant to SEMI standard(E95-0200)

9300 CFG

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